ENBIS Annual Meeting 2022
At the end of June, 2022, Lukas Sommeregger and Horst Lewitschnig from Infineon Technologies Austria AG participated at ENBIS Annual Meeting in Trondheim, Norway with the topic “Lifetime Drift Model for Discrete Data for Semiconductor Devices”.
In automotive industry, semiconductors play a critical role nowadays. Many applications, from airbags to sensors, require electrical components to function.
These semiconductors, or chips, have data sheets where their parameters are specified. These parameters can cover a wide variety of types. They can take continuous or discrete values.
Electrical parameters of semiconductor devices can drift over lifetime. Especially with the upcoming relevance of automated driving vehicles, it is important to control these electrical parameters and their potential drift over their whole life cycle to guarantee quality and safety for the end user.
In this context, statistical models for lifetime drifts of electrical parameters become important.
For the case of continuous parameters, like voltages, currents, and timings, models are already available. In ArchitectECA2030, the focus lies on the development of a new model for the potential lifetime drift of discrete parameters.
If the potential lifetime drift of parameters can be estimated correctly, countermeasures can be taken to guarantee quality targets. Those measures are taken by the manufacturer and by decision systems within automated driving vehicles.
The immediate use of the work lies in the area of quality control and support of a larger PHM (prognostics and health management) framework. The health status of the vehicle can be monitored on-line based on known lifetime behavior models. Furthermore, the remaining useful lifetime of an electronic device can be calculated.
In summary, the focus of this work lies in developing state-of-the-art methods for enabling predictive maintenance and supporting quality control in semiconductors with a focus on automotive products.